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- JEM-2100 Electron Microscope
JEM-2100 Electron Microscope
Multipurpose 200 kV TEM with simple and ease-of-use operability and excellent expandability
Features
The JEM-2100 is a multipurpose, 200 kV analytical electron microscope. Variety of versions is provided to adapt user’s purposes. The JEM-2100, which incorporates an integrated PC system for various functions with excellent cost performance, supports research and development in wide scientific fields, for biology to materials researches.
- Excellent LaB6 electron gun promises excellent performance with a reasonable cost.
- Ultrahigh TEM resolution as high as 0.19 nm (in UHR configuration) enables us to perform an observation at atomic resolution.
- STEM (Scanning Transmission Electron Microscope: option) function integrated in PC control system enables us to see a scanning image of a sample at nanometer resolution.
- EDS (Energy Dispersive X-ray Spectrometer) with a 0.28sr of solid angle (in HR configuration with a 50mm2 detector) performs highly sensitive analysis at nanometer resolution.
- Highly stable specimen stage enables us to perform a long term observation and analysis.
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Specifications
Configuration Ultrahigh resolution*1
(UHR)High resolution*1
(HR)High specimen tilt*1
(HT)Cryo*1
(CR)High contrast*1
(HC)Resolution(nm) Point 0.194 0.23 0.25 0.27 0.31 Lattice 0.14 0.14 0.14 0.14 0.14 Acc. Voltage 80,100,120,160,200 kV Minimum step 50 V Stability Acc. Voltage 2×10-6/min OL Current 1×10-6/min Optical parameters for objective lenses Focal length 1.9 mm 2.3 mm 2.7 mm 2.8 mm 3.9 mm Spherical aber. coeff. 0.5 mm 1.0 mm 1.4 mm 2.0 mm 3.3 mm Chromatic aber. coeff. 1.1 mm 1.4 mm 1.8 mm 2.1 mm 3.0 mm Minimum focal step 1.0 nm 1.5 nm 1.8 nm 2.0 nm 5.2 nm Spot Size ( in diameter) TEM mode 20~200 nm 1 to 5 μm EDS mode 0.5 to 25 nmφ
α selector1.0 to 25 nmφ
α selector1.5 to 35 nmφ
α selector2.0 to 45 nmφ
α selector10 to 500 nm NBD mode CBD mode CB Diffraction Convergent angle
(2α)1.5 to 20 mrad or more - - Acceptance angle ±10° - - Magnification MAG mode ×2,000 to 1,500,000 ×1,500 to 1,200,000 ×1,200 to 1,000,000 ×1,000 to 800,000 LOW MAG mode ×50 to 6,000 ×50 to 2,000 SA MAG mode ×8,000 to 800,000 ×6,000 to 600,000 ×5,000 to 600,000 ×5,000 to 400,000 Camera length SA diff.(mm) 80 to 2,000 100 to 2,500 150 to 3,000 HD diff.(m) 4 to 80 Specimen driving system Tilting angle
X / Y*2±25/±25° ±35/±30° ±42/±30° ±15/±10° ±38/±30° Tilting angle
X*3±25° ±80° ±80° ±80° ±80° Shift(mm) 2 (X,Y)
0.2 (Z±0.1 mm)2 (X,Y)
0.4 (Z±0.2 mm)EDS*4 Solid angle
(30mm2/50mm2)0.13sr/0.24sr 0.13sr/0.28sr 0.13sr/0.23sr *5 0.09sr/- Take-off angle
(30mm2/50mm2)25°/22.3° 25°/24.1° 25°/25° *5 20°/-
*1 : Specify either configuration (UHR, HR, HT, CR or HC) when ordering the JEM-2100.
*2 : With a specimen tilting holder
*3 : With a high-tilt specimen holder
*4 : An optional EDS is required.
*5 : Unavailable to install EDS.
Customers
TLT Technical equipment Co., Ltd.
Sđt: 04 3661 0745
Email: sales@tltech.vn
Email: sales@tltech.vn
Fax: 04 35400699
Tầng 7 tòa nhà 188, đường Trường Chinh, quận Đống Đa, thành phố Hà Nội
Tầng 7 tòa nhà 188, đường Trường Chinh, quận Đống Đa, thành phố Hà Nội
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